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Many of the analytical techniques being applied to solar wind analyses in Genesis collectors are measurements in ion beam instruments. The beams are focused on very small areas and can avoid particles.
This image of a 7 mm long silicon collector fragment was provided by Dr. Amy Jurewicz at Arizona State University. The ion beam area is small and can be placed in particle-free regions of the collector.
38th Lunar and Planetary Science Conference Links
Session Program - Thursday, March 15th
- Ampitheater
Session Program - Poster Session II: Genesis - Thursday,
March 15th - Fitness Center