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Basic characterization of the collector fragments consists of four parts:

1. An overview image to assess size and surface condition
2. High magnification images to assess density of particulate contaminants
3. Measurement of collector thickness to determine which regime of the solar wind was collected
4. Ellipsometry to assess thickness of molecular film contaminant

Catalogs of these characterizations are produced as data is accumulated.

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Editor: Nancy S. Todd
NASA Official: Dr. Carlton Allen
Page generated on November 24, 2009
Last modified on April 18, 2007
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